Semiconductor Manufacturing Equipment
Fortia
Power Device
Power device testing system for 200mm wafer

Fortia

The best system for power device measurement with ACCRETECH's contact technology and wide applications combined with TESEC's measuring technology

Feature

Seamless measurement from DC (large current, high voltage) to L load (avalanche) measurement
Provides a high quality measurement environment with the ATi unit (ACCRETEC TESEC interface unit, DARUMA stage, and pressurization card function

Integrated operation
Tester operation and the display of measurement results can be performed with the probing machine

Wide measurement range from low to extremely high temperatures

Probing machine options
Wider range of options can be installed

Customizable measurement environment
Combination of optional units can build a measurement environment suitable to the device

Quick shut down during L load (avalanche) measurement
The measurement path is shut down quickly if the device fails