Features
Accretech Probing Machine for full wafer testing on a single touch down.
Developed with capability to simultaneously measure on 12 stages with dedicate XY stage and POGO tower.
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About ACCRETECH
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ACCRETECH Group
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Precision Measuring Instrument
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Coordinate Measuring Machines
X-ray CT system
Surface Texture and Contour Measuring Instruments
Non-contact Surface Texture and Contour Measuring Instruments/Systems
Optical shaft measuring system
Roundness and Cylindrical Profile Measuring Instruments
Dedicated measuring machine
Discharge test system
battery jig
Power Supply Evaluation Services
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